• DocumentCode
    1742276
  • Title

    An approach for determining Phong reflectance parameters from real objects

  • Author

    Aparicio, Javier Iglesia ; García-Bermejo, Jaime Gómez

  • Author_Institution
    ETSIT, Valladolid Univ., Spain
  • Volume
    3
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    568
  • Abstract
    Modeling reflectance properties from real objects is useful for solving many practical problems ranging from industrial inspection to computer graphics. In particular building computer graphics models directly from real objects has received increased attention, because it is useful in many important fields such as CAD, entertainment (3D games, movies) and virtual museums. The paper describes an automatic way to recover actual reflectance parameters, from range and intensity (or color) data acquired from objects. The proposed approach is based on the Phong reflection model, since this model is usually preferred for computer graphics
  • Keywords
    computer graphics; light reflection; reflectivity; rendering (computer graphics); 3D games; CAD; Phong reflectance parameters; Phong reflection model; computer graphics models; entertainment; intensity data; movies; range data; real objects; virtual museums; Automatic control; Computer graphics; Computer industry; Electrical equipment industry; Industrial control; Inspection; Optical reflection; Reflectivity; Shape; Systems engineering and theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 2000. Proceedings. 15th International Conference on
  • Conference_Location
    Barcelona
  • ISSN
    1051-4651
  • Print_ISBN
    0-7695-0750-6
  • Type

    conf

  • DOI
    10.1109/ICPR.2000.903609
  • Filename
    903609