DocumentCode
1742276
Title
An approach for determining Phong reflectance parameters from real objects
Author
Aparicio, Javier Iglesia ; García-Bermejo, Jaime Gómez
Author_Institution
ETSIT, Valladolid Univ., Spain
Volume
3
fYear
2000
fDate
2000
Firstpage
568
Abstract
Modeling reflectance properties from real objects is useful for solving many practical problems ranging from industrial inspection to computer graphics. In particular building computer graphics models directly from real objects has received increased attention, because it is useful in many important fields such as CAD, entertainment (3D games, movies) and virtual museums. The paper describes an automatic way to recover actual reflectance parameters, from range and intensity (or color) data acquired from objects. The proposed approach is based on the Phong reflection model, since this model is usually preferred for computer graphics
Keywords
computer graphics; light reflection; reflectivity; rendering (computer graphics); 3D games; CAD; Phong reflectance parameters; Phong reflection model; computer graphics models; entertainment; intensity data; movies; range data; real objects; virtual museums; Automatic control; Computer graphics; Computer industry; Electrical equipment industry; Industrial control; Inspection; Optical reflection; Reflectivity; Shape; Systems engineering and theory;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition, 2000. Proceedings. 15th International Conference on
Conference_Location
Barcelona
ISSN
1051-4651
Print_ISBN
0-7695-0750-6
Type
conf
DOI
10.1109/ICPR.2000.903609
Filename
903609
Link To Document