Title :
Nonparametric Markov random field model analysis of the MeasTex test suite
Author :
Paget, Rupert ; Longstaff, Dennis
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Queensland Univ., Qld., Australia
Abstract :
This paper looks at the nonparametric, multiscale, Markov random field (MRF) model and its application in classifying the MeasTex test suite. The MeasTex test suite is a standard by which various texture classification algorithms can be compared. Typically, today´s texture classification algorithms have been based on supervised classification, whereby all the classification classes have been predefined. We look at a new texture classification scheme, one that does not require a complete set of predefined classes. Instead our texture classification scheme is based on a significance test. A texture is classified on the basis of whether or not its statistical properties can be deemed to be from the same population of statistics as that define a training set texture. If not, texture is deemed unknown. The advantages and disadvantages of such a scheme are discussed in this paper
Keywords :
Markov processes; image classification; image texture; statistical analysis; Markov random field model; MeasTex test suite; image texture; significance test; statistical analysis; texture classification; Application software; Classification algorithms; Earth; Markov random fields; Probability density function; Signal processing; Statistics; Synthetic aperture radar; Testing; Visualization;
Conference_Titel :
Pattern Recognition, 2000. Proceedings. 15th International Conference on
Conference_Location :
Barcelona
Print_ISBN :
0-7695-0750-6
DOI :
10.1109/ICPR.2000.903696