DocumentCode :
1742346
Title :
Nonparametric Markov random field model analysis of the MeasTex test suite
Author :
Paget, Rupert ; Longstaff, Dennis
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Queensland Univ., Qld., Australia
Volume :
3
fYear :
2000
fDate :
2000
Firstpage :
927
Abstract :
This paper looks at the nonparametric, multiscale, Markov random field (MRF) model and its application in classifying the MeasTex test suite. The MeasTex test suite is a standard by which various texture classification algorithms can be compared. Typically, today´s texture classification algorithms have been based on supervised classification, whereby all the classification classes have been predefined. We look at a new texture classification scheme, one that does not require a complete set of predefined classes. Instead our texture classification scheme is based on a significance test. A texture is classified on the basis of whether or not its statistical properties can be deemed to be from the same population of statistics as that define a training set texture. If not, texture is deemed unknown. The advantages and disadvantages of such a scheme are discussed in this paper
Keywords :
Markov processes; image classification; image texture; statistical analysis; Markov random field model; MeasTex test suite; image texture; significance test; statistical analysis; texture classification; Application software; Classification algorithms; Earth; Markov random fields; Probability density function; Signal processing; Statistics; Synthetic aperture radar; Testing; Visualization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition, 2000. Proceedings. 15th International Conference on
Conference_Location :
Barcelona
ISSN :
1051-4651
Print_ISBN :
0-7695-0750-6
Type :
conf
DOI :
10.1109/ICPR.2000.903696
Filename :
903696
Link To Document :
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