DocumentCode :
1742474
Title :
Development of environmental friendly (green), thermally enhanced mold compound (TEMC) for advanced packages
Author :
Tan, T.H. ; Mogi, N. ; Yeoh, L.P.
Author_Institution :
Electron. Devices Mater. Res. Lab. Singapore, Singapore
fYear :
2000
fDate :
2000
Firstpage :
160
Lastpage :
166
Abstract :
This paper outlines the development and performance of a new series of mold compounds with thermal conductivity (λ) up to 100×10-4 cal/cm·s·C (4.2 W/m·K). The alumina and mixture of aluminum nitride and alumina filled mold compound feature a coefficient of thermal expansion of ~10 ppm/K, low warpage with one-side molded BGAs and good anti-solder cracking performance. Being “green”, these halogen and antimony free encapsulants are able to pass high temperature storage life (HTSL) tests at 175°C for more than 1000 hrs. These features are made possible with use of optimum combinations of a carefully selected filler system (up to ~80vol%), epoxy resin system, latent catalyst and new “green” compound technology. Thermal performance indices such as θja values at board level are currently being measured
Keywords :
alumina; aluminium compounds; assembling; ball grid arrays; encapsulation; environmental factors; filled polymers; integrated circuit interconnections; integrated circuit packaging; life testing; moulding; printed circuit testing; soldering; thermal conductivity; thermal expansion; thermal stress cracking; 1000 hr; 175 C; Al2O3; AlN; HTSL tests; TEMC; alumina filled mold compound; aluminum nitride/alumina filled mold compound; anti-solder cracking performance; antimony free encapsulants; board level measurements; coefficient of thermal expansion; environmentally friendly thermally enhanced mold compound; epoxy resin system; filler system; green compound technology; halogen free encapsulants; high temperature storage life tests; latent catalyst; mold compounds; one-side molded BGAs; packages; thermal conductivity; thermal performance indices; thermally enhanced mold compound; warpage; Aluminum nitride; Boron; Ceramics; Conducting materials; Electronic packaging thermal management; Epoxy resins; Polymers; Shape control; Silicon compounds; Thermal conductivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Materials and Packaging, 2000. (EMAP 2000). International Symposium on
Conference_Location :
Hong Kong
Print_ISBN :
0-7803-6654-9
Type :
conf
DOI :
10.1109/EMAP.2000.904147
Filename :
904147
Link To Document :
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