Title :
Complexity analysis of the test generation for interconnection networks
Author :
Seghrouchni, M.A. ; Eleuldj, M.
Author_Institution :
Dept. of Genie Inf., EMI, Rabat, Morocco
Abstract :
This paper deals with complexity analysis of test generation in the case of interconnection networks. The generated test is under the stuck-at fault model (Feng and Wu, 1981), and the functional fault model (Eleuldj et al, 1988). The algebraic and coloration approaches are presented in order to generate test for these networks. This generation is based on sufficient conditions, which define the U-test, NU-test and M-test
Keywords :
automatic test pattern generation; circuit testing; computational complexity; fault diagnosis; multiprocessor interconnection networks; M-test; NU-test; U-test; algebraic approach; coloration approach; complexity analysis; functional fault model; generated test; interconnection networks; stuck-at fault model; test conditions; test generation; Cellular networks; Computer networks; Electromagnetic interference; Electronic mail; Fault diagnosis; Intelligent networks; Multiprocessor interconnection networks; Sufficient conditions; Switches; Testing;
Conference_Titel :
Microelectronics, 2000. ICM 2000. Proceedings of the 12th International Conference on
Conference_Location :
Tehran
Print_ISBN :
964-360-057-2
DOI :
10.1109/ICM.2000.916427
