A statistical methodology for the design of high-performance current steering DAC´s

Author

Crippa, Paolo ; Conti, Marco ; Turchetti, Claudio

Author_Institution

Dipt. di Elettronica e Autom., Ancona Univ., Italy

Volume

5

fYear

2001

fDate

2001

Firstpage

311

Abstract

Random device variations are a key factor limiting the performances of high-resolution CMOS current steering D/A converters. In this paper a novel design methodology based on statistical modeling of MOS drain current has been developed. This technique requires firstly an estimation of mean value and autocorrelation function of a single stochastic process, which all the process/device variations are lumped in. Then a behavioral model of D/A converters has been developed. Finally, the statistical simulation of static performances (DNL and INL) has been carried out for different DAC architectures

Keywords

CMOS integrated circuits; circuit CAD; digital-analogue conversion; integrated circuit design; integrated circuit modelling; statistical analysis; CMOS DAC; DNL; INL; MOS drain current; autocorrelation function; behavioral model; current steering DAC; design methodology; high-performance DAC; high-resolution D/A converters; mismatch modelling; static performances; statistical methodology; statistical modeling; Autocorrelation; Circuits; Covariance matrix; Design methodology; Fluctuations; Mathematical model; Semiconductor device modeling; Statistical analysis; Stochastic processes;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on

Conference_Location

Sydney, NSW

Print_ISBN

0-7803-6685-9

Type

conf

DOI

10.1109/ISCAS.2001.922047

Filename

922047