DocumentCode
1745376
Title
Analysis of general planar waveguides with N segments
Author
Pocksteiner, N. ; Jungwirth, M. ; Kovacs, G. ; Weigel, R.
Author_Institution
Inst. for Commun. & Inf. Eng., Linz Univ., Austria
Volume
1
fYear
2000
fDate
36800
Firstpage
137
Abstract
For the simulation of SAW filters it can be useful to model the filters as planar waveguides, consisting of several segments with assigned material parameters (phase velocities, stiffness constants). For symmetric waveguides with three segments the corresponding theory has been provided by Rooth (1996). In the case of more complex structures (such as transversely coupled resonator filters, TCRF-filters) a transverse velocity profile consisting of more than three (N) segments can be determined. For such structures the present work provides the complete analysis based on a scalar potential as the wave-describing quantity. We obtain a complete set of orthonormal modes into which a transverse excitation can be expanded in order to study its propagation. The general mode spectrum consists of a discrete spectrum of bound modes, a continuous spectrum of semi-bound modes and finally a continuous spectrum of radiation modes. All types of modes are calculated using the stack matrix approach. As to radiation modes, two solutions per eigenvalue exist. Therefore, they must be orthogonalized to enable expansion with a scalar product
Keywords
matrix algebra; planar waveguides; surface acoustic wave waveguides; wave equations; waveguide theory; SAW filter simulation; eigenvalue; orthonormal modes; planar waveguides; radiation modes; scalar potential; stack matrix approach; transverse excitation; transverse velocity profile; transversely coupled resonator filters; wave-describing quantity; Eigenvalues and eigenfunctions; Gratings; Information filtering; Information filters; Partial differential equations; Planar waveguides; Resonator filters; Sawing machines; Transducers; Transmission line matrix methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 2000 IEEE
Conference_Location
San Juan
ISSN
1051-0117
Print_ISBN
0-7803-6365-5
Type
conf
DOI
10.1109/ULTSYM.2000.922525
Filename
922525
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