DocumentCode
1745475
Title
Characterizing piezoceramic material using complex frequency excitation
Author
Pastore, R.A., Jr. ; Ballato, A. ; Kosinski, J.A. ; Cui, H.L.
Volume
1
fYear
2000
fDate
36800
Firstpage
879
Abstract
This paper discusses a new technique to characterize lossy piezoelectric materials. This new method uses a complex frequency to stimulate a resonator´s true resonant point. Parameters that are acquired from the characterization are the material attenuation constant, the impedance at the resonant frequency, an equivalent resistance for circuit modeling and an acoustic viscosity. Knowledge of this information can be very useful to circuit designers and material manufacturers. A nice feature of this technique is that it is easily implemented using and arbitrary waveform generator, a PC with data analysis/acquisition software and an oscilloscope
Keywords
crystal resonators; dielectric loss measurement; piezoceramics; acoustic viscosity; attenuation constant; circuit modeling; complex frequency; complex frequency excitation; data analysis/acquisition software; impedance; lossy piezoelectric materials; oscilloscope; piezoceramic material; resonant frequency; resonant point; resonator; waveform generator; Acoustic materials; Attenuation; Impedance; Manufacturing; Piezoelectric materials; RLC circuits; Resonance; Resonant frequency; Signal generators; Viscosity;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 2000 IEEE
Conference_Location
San Juan
ISSN
1051-0117
Print_ISBN
0-7803-6365-5
Type
conf
DOI
10.1109/ULTSYM.2000.922682
Filename
922682
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