• DocumentCode
    1745475
  • Title

    Characterizing piezoceramic material using complex frequency excitation

  • Author

    Pastore, R.A., Jr. ; Ballato, A. ; Kosinski, J.A. ; Cui, H.L.

  • Volume
    1
  • fYear
    2000
  • fDate
    36800
  • Firstpage
    879
  • Abstract
    This paper discusses a new technique to characterize lossy piezoelectric materials. This new method uses a complex frequency to stimulate a resonator´s true resonant point. Parameters that are acquired from the characterization are the material attenuation constant, the impedance at the resonant frequency, an equivalent resistance for circuit modeling and an acoustic viscosity. Knowledge of this information can be very useful to circuit designers and material manufacturers. A nice feature of this technique is that it is easily implemented using and arbitrary waveform generator, a PC with data analysis/acquisition software and an oscilloscope
  • Keywords
    crystal resonators; dielectric loss measurement; piezoceramics; acoustic viscosity; attenuation constant; circuit modeling; complex frequency; complex frequency excitation; data analysis/acquisition software; impedance; lossy piezoelectric materials; oscilloscope; piezoceramic material; resonant frequency; resonant point; resonator; waveform generator; Acoustic materials; Attenuation; Impedance; Manufacturing; Piezoelectric materials; RLC circuits; Resonance; Resonant frequency; Signal generators; Viscosity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 2000 IEEE
  • Conference_Location
    San Juan
  • ISSN
    1051-0117
  • Print_ISBN
    0-7803-6365-5
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2000.922682
  • Filename
    922682