• DocumentCode
    1745604
  • Title

    A dynamic negative-ion mixing method using high-current heavy ions and electron beam evaporation

  • Author

    Kishimoto, N. ; Zhao, J.P. ; Okubo, N. ; Takeda, Y. ; Gritsyna, V.T.

  • Author_Institution
    Nat. Res. Inst. for Metals, Ibaraki, Japan
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    749
  • Lastpage
    752
  • Abstract
    A new filmmaking technique with high-current negative ions and electron beam evaporation has been developed to fabricate optical insulating films, applying both ion-induced dynamic processes and simultaneous formation of insulating substrates. The dynamic negative-ion mixing (DNIM) method, with negative ions at high dose rates, alleviates surface charging on insulators and attains mass introduction of metal atoms. Negative Cu ions of 60 keV irradiated an a-SiO2 substrate, which simultaneously grew by electron beam evaporation of SiO2. The dose-rate ranged from 5 to 50 μA/cm2 and the deposition rate was maintained constant at 0.2 or 0.4 nm/s and controlled the Cu composition. The DNIM method succeeded in fabricating thick uniform films which were finely dispersed with Nanoparticles. The merit of high flux implantation is spontaneous precipitation of Cu nanoparticles. The nanoparticle-dispersed films showed intense linear and nonlinear optical properties
  • Keywords
    electron beam deposition; insulating thin films; ion beam assisted deposition; ion beam mixing; nonlinear optics; 60 keV; a-SiO2 substrate; dose-rate; dynamic negative-ion mixing method; electron beam evaporation; filmmaking technique; high flux implantation; high-current heavy ions; linear optical properties; nonlinear optical properties; optical insulating films; spontaneous precipitation; surface charging; Atom optics; Electron beams; Electron optics; Insulation; Nanoparticles; Nonlinear optics; Optical films; Optical mixing; Particle beam optics; Surface charging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ion Implantation Technology, 2000. Conference on
  • Conference_Location
    Alpbach
  • Print_ISBN
    0-7803-6462-7
  • Type

    conf

  • DOI
    10.1109/.2000.924262
  • Filename
    924262