DocumentCode
1745752
Title
Phenomenological model for the microwave surface resistance of the high temperature superconductors
Author
Srivastava, G.P. ; Daya, K.S. ; Tyagi, G.S. ; Das, V.G.
Author_Institution
Dept. of Electron. Sci., Delhi Univ., India
fYear
2000
fDate
2000
Firstpage
612
Lastpage
616
Abstract
This paper presents a simple empirical model based on the two fluid model that explains the occurrence of anomalous low temperature microwave resistive peaks in high temperature superconductors. One of the key features is the presence of impurities in the sample, which affect the magnitude and position of the surface resistance peak resulting in different power losses at different impurity levels. Thus the appropriate doping concentration can control these power losses
Keywords
electric resistance; high-temperature superconductors; impurities; microwave materials; modelling; anomalous low temperature microwave resistive peaks; doping concentration; empirical model; high temperature superconductors; impurities; impurity level; microwave surface resistance; phenomenological model; power losses; surface resistance peak; two fluid model; Charge carriers; Conducting materials; Conductivity; Fabrication; High temperature superconductors; Impurities; Scattering; Superconducting transition temperature; Superconductivity; Surface resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 2000 Asia-Pacific
Conference_Location
Sydney, NSW
Print_ISBN
0-7803-6435-X
Type
conf
DOI
10.1109/APMC.2000.925909
Filename
925909
Link To Document