• DocumentCode
    1745752
  • Title

    Phenomenological model for the microwave surface resistance of the high temperature superconductors

  • Author

    Srivastava, G.P. ; Daya, K.S. ; Tyagi, G.S. ; Das, V.G.

  • Author_Institution
    Dept. of Electron. Sci., Delhi Univ., India
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    612
  • Lastpage
    616
  • Abstract
    This paper presents a simple empirical model based on the two fluid model that explains the occurrence of anomalous low temperature microwave resistive peaks in high temperature superconductors. One of the key features is the presence of impurities in the sample, which affect the magnitude and position of the surface resistance peak resulting in different power losses at different impurity levels. Thus the appropriate doping concentration can control these power losses
  • Keywords
    electric resistance; high-temperature superconductors; impurities; microwave materials; modelling; anomalous low temperature microwave resistive peaks; doping concentration; empirical model; high temperature superconductors; impurities; impurity level; microwave surface resistance; phenomenological model; power losses; surface resistance peak; two fluid model; Charge carriers; Conducting materials; Conductivity; Fabrication; High temperature superconductors; Impurities; Scattering; Superconducting transition temperature; Superconductivity; Surface resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2000 Asia-Pacific
  • Conference_Location
    Sydney, NSW
  • Print_ISBN
    0-7803-6435-X
  • Type

    conf

  • DOI
    10.1109/APMC.2000.925909
  • Filename
    925909