DocumentCode :
1747874
Title :
An algorithm for bi-decomposition of logic functions
Author :
Mishchenko, Alan ; Steinbach, Bernd ; Perkowski, Marek
Author_Institution :
Portland State Univ., OR, USA
fYear :
2001
fDate :
2001
Firstpage :
103
Lastpage :
108
Abstract :
We propose a new BDD-based method for decomposition of multi-output incompletely specified logic functions into netlists of two-input logic gates. The algorithm uses the internal don´t-cares during the decomposition to produce compact well-balanced netlists with short delay. The resulting netlists are provably nonredundant and facilitate test pattern generation. Experimental results over MCNC benchmarks show that our approach outperforms SIS and other BDD-based decomposition methods in terms of area and delay of the resulting circuits with comparable CPU time.
Keywords :
automatic test pattern generation; binary decision diagrams; delays; logic gates; logic testing; BDD-based method; MCNC benchmarks; area; bi-decomposition; delay; internal don´t-cares; multi-output incompletely specified logic functions; nonredundant netlists; test pattern generation; two-input logic gates; Benchmark testing; Boolean functions; Circuits; Data structures; Delay effects; Logic functions; Logic gates; Partitioning algorithms; Permission; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2001. Proceedings
ISSN :
0738-100X
Print_ISBN :
1-58113-297-2
Type :
conf
DOI :
10.1109/DAC.2001.156117
Filename :
935486
Link To Document :
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