• DocumentCode
    1749280
  • Title

    Technical image reduction using NN and wavelet

  • Author

    Chiarantoni, Ernesto ; Lecce, Vincenzo Di ; Guerriero, Andrea

  • Author_Institution
    Dipartimento di Elettrotecnica ed Elettronica, Politecnico di Bari, Italy
  • Volume
    2
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    1536
  • Abstract
    A general-purpose procedure for scaling technical line drawings, suitable for video presentation, is described. The proposed method is based on the separate processing of scalable (layout) and non-scalable (symbol) elements, drawn from standard technical drafting symbols, detected by a cluster-based template procedure and a minimum distance classifier, are extracted from drawings and utilized to form a symbols position table. To obtain the clusters of symbols, a rival penalized competitive learning neural network and a human template labeling procedure have been adopted. The extraction of symbols from drawings produces clear layouts. These layouts are scaled down by wavelet based algorithm and the symbols are then restored or replaced, through the symbols position table, with different graphs or textual representations, according to the scaling factors and the display device. The results of an experimental study on a large database of technical drawing are presented and the accuracy of the system is discussed
  • Keywords
    document image processing; engineering graphics; image segmentation; neural nets; object recognition; unsupervised learning; wavelet transforms; competitive learning; image segmentation; minimum distance classifier; neural network; symbol recognition; technical image reduction; technical line drawing scaling; template labeling; wavelet; Digital images; Engineering drawings; Graphics; Humans; Image databases; Information management; Layout; Monitoring; Neural networks; Technical drawing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Networks, 2001. Proceedings. IJCNN '01. International Joint Conference on
  • Conference_Location
    Washington, DC
  • ISSN
    1098-7576
  • Print_ISBN
    0-7803-7044-9
  • Type

    conf

  • DOI
    10.1109/IJCNN.2001.939593
  • Filename
    939593