• DocumentCode
    1749982
  • Title

    Applications to photoconductor-ferroelectric memory of PZT thin films

  • Author

    Adachi, M. ; Wang, W. ; Karaki, T.

  • Author_Institution
    Dept. of Electron. & Informatics, Toyama Prefectural Univ., Japan
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    71
  • Abstract
    Zr-rich PZT films have been successfully grown on both PLT/Pt/Ti/SiO2/Si and Ir/SiO2/Si substrates by RF magnetron sputtering using multi metal targets. A photoconductor-ferroelectric memory (PFM) is proposed in this paper. The basic principle of the PFM is to form a two layers integration structure of ferroelectric film and a-Si:H film. This PFM device with the structure of ITO/a-Si:H/PZT/Ir/SiO2/Si has been prepared by the RF magnetron sputtering method. The photoconductive effect of a-Si:H under the focused laser beam is used for addressing. The remanent polarization directions of the PZT ferroelectric layer are used for "1" or "0" states of memory. The pyroelectric current directions are used for read-out. The hysteresis loop of the single cell was observed and the pyroelectric current and its direction was read-out by lamp illumination. Thus, the write and readout characteristics of the PFM have been demonstrated
  • Keywords
    dielectric hysteresis; ferroelectric storage; ferroelectric thin films; lead compounds; photoconducting devices; pyroelectric devices; sputtered coatings; ITO-Si:H-PZT-Ir-SiO2-Si; ITO/a-Si:H/PZT/Ir/SiO2/Si structure; InSnO-Si:H-PbZrO3TiO3-Ir-SiO2-Si; Ir/SiO2/Si substrate; PLT/Pt/Ti/SiO2/Si substrate; PZT ferroelectric thin film; RF magnetron sputtering; a-Si:H film; focused laser beam; hysteresis loop; photoconductive effect; photoconductor-ferroelectric memory; pyroelectric current; remanent polarization; Ferroelectric films; Indium tin oxide; Laser beams; Magnetic devices; Photoconductivity; Pyroelectricity; Radio frequency; Semiconductor films; Sputtering; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2000. ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on
  • Conference_Location
    Honolulu, HI
  • ISSN
    1099-4734
  • Print_ISBN
    0-7803-5940-2
  • Type

    conf

  • DOI
    10.1109/ISAF.2000.941514
  • Filename
    941514