• DocumentCode
    1750007
  • Title

    Structure-property relations in sol-coated PMN ceramics: microscopy, dielectric and electromechanical response

  • Author

    Sehirlioglu, A. ; Yoon, C.H. ; Pilgrim, S.M.

  • Author_Institution
    New York State Coll. of Ceramics, Alfred, NY, USA
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    253
  • Abstract
    Some of the most promising materials for electrostrictive response are lead magnesium niobate ceramics (PMN); however, the properties of a given composition are only optimum in a limited range of temperatures. In a previous study, it was found that sol coating of PMN particles modified and improved the electromechanical and/or dielectric properties of the resulting product-doubling induced strain in some cases. This work concentrates on the results from sol coatings containing Ti, Zn and Ba (mol percent cation levels of 1 to 8). Among all compositions, combined additions of Ti and Zn gave the largest increment in properties. Electrical measurements of dielectric constant, loss, polarization, and strain were performed to obtain the properties for sol-coated ceramics. Diffraction and microscopic work showed that improved properties were correlated with the appearance of a number of discrete second phases
  • Keywords
    X-ray diffraction; dielectric losses; dielectric polarisation; electron microscopy; electrostriction; lead compounds; permittivity; piezoceramics; sol-gel processing; PMN; PbMgO3NbO3; X-ray diffraction; dielectric constant; dielectric loss; dielectric polarization; dielectric response; electromechanical response; electron microscopy; electrostriction; sol-coated PMN ceramic; strain; structure-property relations; Ceramics; Coatings; Composite materials; Dielectric loss measurement; Dielectric materials; Electrostriction; Magnesium; Niobium compounds; Strain measurement; Zinc;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2000. ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on
  • Conference_Location
    Honolulu, HI
  • ISSN
    1099-4734
  • Print_ISBN
    0-7803-5940-2
  • Type

    conf

  • DOI
    10.1109/ISAF.2000.941551
  • Filename
    941551