• DocumentCode
    175129
  • Title

    A circuit-level model for accurately modeling 3rd order nonlinearity in CMOS passive mixers

  • Author

    Yuksel, Hazal ; Dong Yang ; Molnar, A.C.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Cornell Univ., Ithaca, NY, USA
  • fYear
    2014
  • fDate
    1-3 June 2014
  • Firstpage
    127
  • Lastpage
    130
  • Abstract
    Many MOSFET models have discontinuities in the 2nd derivative of their drain current with respect to their drain-source voltage. Because these discontinuities occur at Vds = 0V, they have little effect on simulations of active circuits, but matter when simulating transistors in deep triode, such as CMOS passive mixers. These discontinuities result in qualitatively incorrect simulations of the effects of third order nonlinearity, with the 3rd harmonic behaving proportional to the square of the input signal amplitude, A2, instead of A3. In this paper, we present a schematic-level modeling technique that can be easily implemented over any model that fails the Gummel Symmetry Test (e.g. BSIM4) without altering underlying physical equations. We then show how the model performs with respect to IM3 simulations ensuring correct magnitude and slope by comparing our model to measurements from an 8-phase passive mixer manufactured in a deep sub-micron process.
  • Keywords
    CMOS integrated circuits; MOSFET; mixers (circuits); 3rd order nonlinearity; BSIM4; CMOS passive mixers; Gummel symmetry test; IM3 simulations; MOSFET models; active circuits; circuit-level model; deep submicron process; deep triode; drain current; drain-source voltage; schematic-level modeling technique; signal amplitude; Computational modeling; Harmonic analysis; Integrated circuit modeling; Mathematical model; Mixers; Semiconductor device modeling; Transistors; IM3; MOSFET modeling; RF CMOS; distortion; harmonic analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Frequency Integrated Circuits Symposium, 2014 IEEE
  • Conference_Location
    Tampa, FL
  • ISSN
    1529-2517
  • Print_ISBN
    978-1-4799-3862-9
  • Type

    conf

  • DOI
    10.1109/RFIC.2014.6851676
  • Filename
    6851676