Pressure dependence of secondary NIR scintillation

Author

Fraga, M.M.R. ; Bueno, C.C. ; Goncalves, J.A.C. ; Fraga, F.A.F. ; Ferreira Marques, Rui ; Policarpo, A.J.P.L.

Author_Institution

Dept. de Fisica, Coimbra Univ., Portugal

Volume

1

fYear

2000

fDate

2000

Abstract

The variation with the charge gain of the total number of photons emitted per electron, in the visible and NIR regions (0.4<λ<1 μm), in Ar/CF₄ mixtures, is investigated for CF₄ concentrations below 15%. Measurements are performed in a uniform field configuration and results are presented for charge gains below 100, under X-ray excitation. The spectral distribution of the emitted light in Ar/CF₄ mixtures is also analyzed. The pressure dependence (1-5 atm) of the secondary light output, in the visible and near infrared regions (NIR) is studied as a function of the reduced electric field E/P for pure argon and argon-tetrafluoromethane mixtures. Above charge multiplication threshold, the number of NIR photons decreases with increasing pressure

Keywords

gas mixtures; gas scintillation detectors; scintillation; 0.4 to 1 mum; 1 to 5 atm; Ar-tetrafluoromethane mixtures; Ar/CF₄ mixtures; IR photons; X-ray excitation; carbon tetrafluoride concentrations; charge gain; multiplication threshold; near infrared regions; pressure dependence; secondary NIR scintillation; uniform field configuration; Argon; Atomic measurements; Charge coupled devices; Charge measurement; Current measurement; Electron emission; Gain measurement; Optical imaging; Performance evaluation; Solid scintillation detectors;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium Conference Record, 2000 IEEE

Conference_Location

Lyon

ISSN

1082-3654

Print_ISBN

0-7803-6503-8

Type

conf

DOI

10.1109/NSSMIC.2000.949102

Filename

949102