DocumentCode :
1752060
Title :
Fast neutron and alpha detection using LiBaF3 scintillator
Author :
Reeder, P.L. ; Bowyer, S.M.
Author_Institution :
Pacific Northwest Lab., Richland, WA, USA
Volume :
1
fYear :
2000
fDate :
2000
Firstpage :
27912
Abstract :
Pulse shape discrimination techniques using the scintillator LiBaF 3 allow very clean separation of densely ionizing radiation (protons, tritons, alphas, etc.) from less densely ionizing radiation (electrons). The pulse shape discrimination is based on the presence or absence of subnanosecond core-valence luminescence and in crystals doped with Ce+3 in the presence or absence of Ce luminescence. We use a pulse discrimination technique based on integration of the signal over a short time interval compared to integration over a long time interval. Thermal neutron capture events, fast neutron capture events, fast neutron elastic scattering events on Li, and alpha events from Ra impurities in the scintillator have distinctive loci in a two-dimensional plot of the short gate pulse heights versus long gate pulse heights. The resolution (FWHM) of the 137Cs gamma photopeak is about 16% and the resolution of the thermal neutron peak from neutron capture on 6Li is about 17%. Applications of this scintillator include measurements of fast to thermal neutron ratios, fast neutron spectroscopy, alpha contamination etc. in the presence of significant gamma radiation
Keywords :
alpha-particle detection; ionoluminescence; lithium compounds; neutron detection; solid scintillation detectors; Ce luminescence; Ce+3; LiBaF3 scintillator; LiBaF3:Ce; alpha detection; core-valence luminescence; fast neutron capture; fast neutron spectroscopy; long gate pulse height; neutron detection; pulse shape discrimination; short gate pulse height; thermal neutron capture; Crystals; Electrons; Impurities; Ionizing radiation; Luminescence; Neutrons; Protons; Pulse shaping methods; Scattering; Shape;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2000 IEEE
Conference_Location :
Lyon
ISSN :
1082-3654
Print_ISBN :
0-7803-6503-8
Type :
conf
DOI :
10.1109/NSSMIC.2000.949124
Filename :
949124
Link To Document :
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