Title :
The level-2 muon trigger at D0
Author :
Fortner, M. ; Maciel, A. ; Evans, H. ; Kothari, B. ; Uzunyan, S.
Author_Institution :
Northern Illinois Univ., DeKalb, IL, USA
Abstract :
The upgraded D0 detector at the Fermilab Tevatron will feature a new three level trigger based on physics object recognition. The Level-2 muon trigger is required to use the timing data from the muon wire chambers and scintillator to find track segments, and then match those segments with Level-1 muon and fiber tracker trigger information. To accomplish this task the Level-2 muon trigger features a three stage approach. The first stage uses a parallel set of custom VME cards that route data through a high speed and configurable bus to a series of 200 MHz Texas Instruments DSPs. This will reduce the large data volume distributed over some 140 sources to a manageable set of 3D track stubs from the 15 cards. Data from these boards are combined to form muon track candidates in the second stage using another custom board built around a 500 MHz Digital Alpha processor chip. In the the third stage another Alpha-based board matches the muon tracks with tracks found in the central tracking trigger and is able to correlate those muons with other physics objects in the event such as jets. Queueing simulations of the system running at a rate consistent with the expected input rate and desired background rejection have shown that the Level-2 muon trigger will produce a dead time less than 5%
Keywords :
drift chambers; muon detection; nuclear electronics; solid scintillation detectors; trigger circuits; 3D track stubs; Alpha-based board; Fermilab Tevatron; central tracking trigger; custom VME cards; data volume; level-2 muon trigger; muon track candidates; muon wire chambers; physics object recognition; three level trigger; timing data; upgraded D0 detector; Detectors; Digital signal processing; Field programmable gate arrays; Instruments; Iron; Mesons; Object detection; Physics; Timing; Wire;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2000 IEEE
Conference_Location :
Lyon
Print_ISBN :
0-7803-6503-8
DOI :
10.1109/NSSMIC.2000.949929