DocumentCode
1752374
Title
An impact parameter trigger for the DØ experiment
Author
Taylor, Wendy
Author_Institution
State Univ. of New York, Stony Brook, NY, USA
Volume
2
fYear
2000
fDate
2000
Firstpage
42734
Abstract
We describe a trigger preprocessor to be used by the DØ experiment for selecting events with tracks from the decay of long-lived particles. This Level 2 impact parameter trigger utilizes information from the Silicon Microstrip Tracker to reconstruct tracks with improved spatial and momentum resolutions compared to those obtained by the Level 1 tracking trigger. It is constructed of VME boards with much of the logic existing in programmable processors. A common motherboard provides the I/O infrastructure and three different daughter boards perform the tasks of identifying the roads from the tracking trigger data, finding the clusters in the roads in the silicon detector, and fitting tracks to the clusters. This approach provides flexibility for the design, testing and maintenance phases of the project. The track parameters are provided to the trigger framework in twenty-five microseconds. The impact parameter is measured with a thirty-five micron resolution
Keywords
nuclear electronics; silicon radiation detectors; system buses; trigger circuits; DO experiment; I/O infrastructure; Silicon Microstrip Tracker; VME boards; impact parameter trigger; level 2 impact parameter trigger; long-lived particles; programmable processors; trigger preprocessor; Backplanes; Connectors; Detectors; Hardware; Logic; Microstrip components; Roads; Silicon; Strips; Surface-mount technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2000 IEEE
Conference_Location
Lyon
ISSN
1082-3654
Print_ISBN
0-7803-6503-8
Type
conf
DOI
10.1109/NSSMIC.2000.949934
Filename
949934
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