• DocumentCode
    1752374
  • Title

    An impact parameter trigger for the DØ experiment

  • Author

    Taylor, Wendy

  • Author_Institution
    State Univ. of New York, Stony Brook, NY, USA
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    42734
  • Abstract
    We describe a trigger preprocessor to be used by the DØ experiment for selecting events with tracks from the decay of long-lived particles. This Level 2 impact parameter trigger utilizes information from the Silicon Microstrip Tracker to reconstruct tracks with improved spatial and momentum resolutions compared to those obtained by the Level 1 tracking trigger. It is constructed of VME boards with much of the logic existing in programmable processors. A common motherboard provides the I/O infrastructure and three different daughter boards perform the tasks of identifying the roads from the tracking trigger data, finding the clusters in the roads in the silicon detector, and fitting tracks to the clusters. This approach provides flexibility for the design, testing and maintenance phases of the project. The track parameters are provided to the trigger framework in twenty-five microseconds. The impact parameter is measured with a thirty-five micron resolution
  • Keywords
    nuclear electronics; silicon radiation detectors; system buses; trigger circuits; DO experiment; I/O infrastructure; Silicon Microstrip Tracker; VME boards; impact parameter trigger; level 2 impact parameter trigger; long-lived particles; programmable processors; trigger preprocessor; Backplanes; Connectors; Detectors; Hardware; Logic; Microstrip components; Roads; Silicon; Strips; Surface-mount technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2000 IEEE
  • Conference_Location
    Lyon
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-6503-8
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2000.949934
  • Filename
    949934