Title :
The GREAT triggerless total data readout method
Author :
Lazarus, I.H. ; Appelbe, D.E. ; Butler, P.A. ; Coleman-Smith, P.J. ; Cresswell, J.R. ; Freeman, S.J. ; Herzberg, R.D. ; Hibbert, I. ; Joss, D.T. ; Letts, S.C. ; Page, R.D. ; Pucknell, V.F.E. ; Regan, P.H. ; Sampson, J. ; Simpson, J. ; Thornhil, J. ; Wadsw
Author_Institution :
SERC Daresbury Lab., Warrington, UK
Abstract :
Recoil Decay Tagging (RDT) is a very powerful method for the spectroscopy of exotic nuclei. RDT is a delayed coincidence technique between detectors usually at the target position and at the focal plane of a spectrometer. Such measurements are often limited by dead time. This paper describes a novel triggerless data acquisition method which is being developed for the Gamma Recoil Electron Alpha Tagging (GREAT) spectrometer that overcomes this limitation by virtually eliminating dead time. Our solution is a Total Data Readout (TDR) method where all channels run independently and are associated in software to reconstruct events. The TDR method allows all the data from both target position and focal plane to be collected with practically no dead time losses. Each data word is associated with a timestamp generated from a global 100 MHz clock. Events are then reconstructed in real time in the event builder using temporal and spatial associations defined by the physics of the experiment
Keywords :
amplifiers; data acquisition; gamma-ray detection; gamma-ray spectrometers; nuclear electronics; readout electronics; 100 MHz; GREAT triggerless total data readout method; data word; dead time; delayed coincidence technique; event reconstruction; exotic nuclei spectroscopy; gamma recoil electron alpha tagging spectometer; global clock; recoil decay tagging; shaping amplifiers; target position; timestamp; triggerless data acquisition method; Gamma ray detection; Gamma ray detectors; Gamma rays; Particle separators; Physics; Radiation detectors; Silicon radiation detectors; Spectroscopy; Strips; Tagging;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2000 IEEE
Conference_Location :
Lyon
Print_ISBN :
0-7803-6503-8
DOI :
10.1109/NSSMIC.2000.949943