• DocumentCode
    1752389
  • Title

    The transient response analysis of EMP coupling through apertures

  • Author

    Zhe, Yan ; Xin, Yang ; Xiaoliang, Bi ; JiaXiang, Yang

  • Author_Institution
    Harbin University of Science Technology
  • Volume
    2
  • fYear
    2006
  • fDate
    14-18 Aug. 2006
  • Firstpage
    526
  • Lastpage
    528
  • Keywords
    Apertures; Circuit testing; Computational modeling; Coupling circuits; EMP radiation effects; Fourier transforms; Frequency measurement; Transient analysis; Transient response; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2006. EMC 2006. 2006 IEEE International Symposium on
  • Conference_Location
    Portland, OR, USA
  • Print_ISBN
    1-4244-0293-X
  • Type

    conf

  • DOI
    10.1109/ISEMC.2006.1706361
  • Filename
    1706361
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1752389