DocumentCode
1753096
Title
Testing and Analyzing the Electrical Performances of Piezoelectric SMART Layer
Author
Tang, Shoufeng ; Xiong, Ke ; Du, Yuyuan ; Li, Gang
Author_Institution
Sch. of Commun. & Electron. Eng., China Univ. of Min. & Technol., Xuzhou
Volume
1
fYear
0
fDate
0-0 0
Firstpage
5013
Lastpage
5017
Abstract
The electrical performances of piezoelectric SMART Layer (Stanford Multi-Actuator-Receiver Transduction Layer) were studied by active monitoring technique based on Lamb wave. The signal uniformity and consistency were examined and compared with the performances of piezoelectric wafers. It is pointed that sensor responses overlapped on the same plot in four group experiments. These maximal amplitude biases relative to average amplitude were as follows: 3.54% in signal consistency over time; 6.2% in signal consistency on loading; 5.9% in signal consistency after loading; 11.7% in signal uniformity. The results indicate that the piezoelectric SMART Layer could not only keep consistency of piezoelectric wafer´s electrical performances, but also improve its signal uniformity, and therefore could permit them to be used for active, on-line structural health monitoring in real applications
Keywords
condition monitoring; crack detection; piezoelectric actuators; piezoelectric transducers; signal processing; surface acoustic waves; Lamb wave; Stanford MultiActuator-Receiver Transduction Layer; active monitoring; active online structural health monitoring; electrical performance analysis; piezoelectric SMART layer; piezoelectric wafers; sensor response; signal consistency; signal uniformity; Automation; Computerized monitoring; Electronic equipment testing; Electronic mail; Intelligent control; Intelligent sensors; Performance analysis; Performance evaluation; Space technology; Lamb Wave; active monitoring; electrical performances; piezoelectric SMART Layer; structural health monitoring;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Control and Automation, 2006. WCICA 2006. The Sixth World Congress on
Conference_Location
Dalian
Print_ISBN
1-4244-0332-4
Type
conf
DOI
10.1109/WCICA.2006.1713342
Filename
1713342
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