• DocumentCode
    1753096
  • Title

    Testing and Analyzing the Electrical Performances of Piezoelectric SMART Layer

  • Author

    Tang, Shoufeng ; Xiong, Ke ; Du, Yuyuan ; Li, Gang

  • Author_Institution
    Sch. of Commun. & Electron. Eng., China Univ. of Min. & Technol., Xuzhou
  • Volume
    1
  • fYear
    0
  • fDate
    0-0 0
  • Firstpage
    5013
  • Lastpage
    5017
  • Abstract
    The electrical performances of piezoelectric SMART Layer (Stanford Multi-Actuator-Receiver Transduction Layer) were studied by active monitoring technique based on Lamb wave. The signal uniformity and consistency were examined and compared with the performances of piezoelectric wafers. It is pointed that sensor responses overlapped on the same plot in four group experiments. These maximal amplitude biases relative to average amplitude were as follows: 3.54% in signal consistency over time; 6.2% in signal consistency on loading; 5.9% in signal consistency after loading; 11.7% in signal uniformity. The results indicate that the piezoelectric SMART Layer could not only keep consistency of piezoelectric wafer´s electrical performances, but also improve its signal uniformity, and therefore could permit them to be used for active, on-line structural health monitoring in real applications
  • Keywords
    condition monitoring; crack detection; piezoelectric actuators; piezoelectric transducers; signal processing; surface acoustic waves; Lamb wave; Stanford MultiActuator-Receiver Transduction Layer; active monitoring; active online structural health monitoring; electrical performance analysis; piezoelectric SMART layer; piezoelectric wafers; sensor response; signal consistency; signal uniformity; Automation; Computerized monitoring; Electronic equipment testing; Electronic mail; Intelligent control; Intelligent sensors; Performance analysis; Performance evaluation; Space technology; Lamb Wave; active monitoring; electrical performances; piezoelectric SMART Layer; structural health monitoring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Control and Automation, 2006. WCICA 2006. The Sixth World Congress on
  • Conference_Location
    Dalian
  • Print_ISBN
    1-4244-0332-4
  • Type

    conf

  • DOI
    10.1109/WCICA.2006.1713342
  • Filename
    1713342