• DocumentCode
    17539
  • Title

    Improved PLS Focused on Key-Performance-Indicator-Related Fault Diagnosis

  • Author

    Shen Yin ; Xiangping Zhu ; Kaynak, Okyay

  • Author_Institution
    Coll. of Eng., Bohai Univ., Jinzhou, China
  • Volume
    62
  • Issue
    3
  • fYear
    2015
  • fDate
    Mar-15
  • Firstpage
    1651
  • Lastpage
    1658
  • Abstract
    Standard partial least squares (PLS) serves as a powerful tool for key performance indicator (KPI) monitoring in large-scale process industry for last two decades. However, the standard approach and its recent modifications still encounter some problems for fault diagnosis related to KPI of the underlying process. To cope with these difficulties, an improved PLS (IPLS) approach is presented in this paper. IPLS is able to decompose the measurable process variables into the KPI-related and unrelated parts, respectively. Based on it, the corresponding test statistics are designed to offer meaningful fault diagnosis information and thus, the corresponding maintenance actions can be further taken to ensure the desired performance of the systems. In order to demonstrate the effectiveness of the proposed approach, a numerical example and Tennessee Eastman (TE) benchmark process are respectively utilized. It can be seen that the proposed approach shows satisfactory results not only for diagnosing KPI-related faults but also for its high fault detection rate.
  • Keywords
    fault diagnosis; least squares approximations; maintenance engineering; process monitoring; IPLS; KPI monitoring; TE benchmark process; Tennessee Eastman benchmark process; fault detection rate; improved partial least squares; key-performance-indicator-related fault diagnosis; large-scale process industry; maintenance actions; measurable process variables; Benchmark testing; Fault detection; Fault diagnosis; Loading; Matrix decomposition; Monitoring; Standards; Fault diagnosis; Tennessee Eastman (TE) process; improved partial least squares (IPLS); key performance indicator (KPI);
  • fLanguage
    English
  • Journal_Title
    Industrial Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0046
  • Type

    jour

  • DOI
    10.1109/TIE.2014.2345331
  • Filename
    6873303