• DocumentCode
    1754883
  • Title

    A Landscape of the New Dark Silicon Design Regime

  • Author

    Taylor, Michael Bedford

  • Author_Institution
    Univ. of California, San Diego, La Jolla, CA, USA
  • Volume
    33
  • Issue
    5
  • fYear
    2013
  • fDate
    Sept.-Oct. 2013
  • Firstpage
    8
  • Lastpage
    19
  • Abstract
    Because of the breakdown of Dennard scaling, the percentage of a silicon chip that can switch at full frequency drops exponentially with each process generation. This utilization wall forces designers to ensure that, at any point in time, large fractions of their chips are effectively "dark silicon"--that is, significantly underclocked or idle for large periods of time. As exponentially larger fractions of a chip\´s transistors become dark, silicon area becomes an exponentially cheaper resource relative to power and energy consumption. This shift is driving a new class of architectural techniques that "spend" area to "buy" energy efficiency. All these techniques seek to introduce new forms of heterogeneity into the computational stack. This article begins by examining four promising directions--the "four horsemen"--that have emerged as top contenders for thriving in the dark silicon age. Each direction carries with its virtues deep-seated restrictions that require a careful understanding of the underlying trade-offs and benefits. Furthermore, the author proposes a set of evolutionary dark silicon design principles and examines how one of the "darkest" computing architectures of all, the human brain, trades off energy and area in ways that provide potential insights into more revolutionary directions for computer architecture.
  • Keywords
    computer architecture; energy conservation; energy consumption; microprocessor chips; power aware computing; silicon; Dennard scaling breakdown; architectural techniques; chip transistors; computer architecture; dark silicon design regime; energy consumption; energy efficiency; evolutionary dark silicon design principles; power consumption; process generation; silicon chip; CMOS integrated circuits; Capacitance; Dark silicon; Electric breakdown; Energy efficiency; Multicore processing; Semiconductor device manufacture; Silicon; Threshold voltage; Transistors; Dennard scaling; dark silicon; four horsemen; multicore; utilization wall;
  • fLanguage
    English
  • Journal_Title
    Micro, IEEE
  • Publisher
    ieee
  • ISSN
    0272-1732
  • Type

    jour

  • DOI
    10.1109/MM.2013.90
  • Filename
    6583151