• DocumentCode
    1756694
  • Title

    Surface-Normal Ge/SiGe Asymmetric Fabry–Perot Optical Modulators Fabricated on Silicon Substrates

  • Author

    Audet, Ross M. ; Edwards, Elizabeth H. ; Balram, Krishna C. ; Claussen, Stephanie A. ; Schaevitz, Rebecca K. ; Tasyurek, Emel ; Yiwen Rong ; Fei, Edward I. ; Kamins, Theodore I. ; Harris, James S. ; Miller, David A. B.

  • Author_Institution
    Edward L. Ginzton Lab., Stanford Univ., Stanford, CA, USA
  • Volume
    31
  • Issue
    24
  • fYear
    2013
  • fDate
    Dec.15, 2013
  • Firstpage
    3995
  • Lastpage
    4003
  • Abstract
    We demonstrate the first vertical-incidence Ge/SiGe quantum well reflection modulators fabricated entirely on standard silicon substrates. These modulators could help enable massively parallel, free-space optical interconnects to silicon chips. An asymmetric Fabry-Perot resonant cavity is formed around the quantum well region by alkaline etching the backside of the Si substrate to leave suspended SiGe membranes, upon which high-index-contrast Bragg mirrors are deposited. Electroabsorption and electrorefraction both contribute to the reflectance modulation. The devices exhibit greater than 10 dB extinction ratio with low insertion loss of 1.3 dB. High-speed modulation with a 3 dB bandwidth of 4 GHz is demonstrated. The moderate-Q cavity (Q ~ 600) yields an operating bandwidth of more than 1 nm and permits operation without active thermal stabilization.
  • Keywords
    Fabry-Perot resonators; electroabsorption; germanium; mirrors; optical modulation; silicon compounds; Ge-SiGe; electroabsorption; electrorefraction; high-index-contrast Bragg mirrors; quantum well reflection modulators; silicon substrates; surface-normal asymmetric Fabry-Perot optical modulators; Absorption; Cavity resonators; Epitaxial growth; Mirrors; Modulation; Silicon; Silicon germanium; Integrated optoelectronics; optical interconnections; optical modulation;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2013.2279174
  • Filename
    6583953