Title :
Analysis of Average Power Tracking Doherty Power Amplifier
Author :
Yunsik Park ; Juyeon Lee ; Seokhyeon Kim ; Donggyu Minn ; Bumman Kim
Author_Institution :
Div. of IT Convergence Eng., Pohang Univ. of Sci. & Technol. (POSTECH), Pohang, South Korea
Abstract :
An average power tracking (APT) Doherty power amplifier (PA) is analyzed in terms of its biasing voltage condition, efficiency, and output power. And the drain and gate bias voltages are optimized for operation at different output power conditions. The Doherty power amplifier is designed using 45 W gallium nitride (GaN) high electron mobility transistors (HEMT) for the carrier and peaking cells at 1.94 GHz. The bias voltages are controlled for each average power level(42.9 dBm, 39.9 dBm, 37 dBm). The measured drain efficiencies and gains are 53.2%, 12.8 dB at 42.9 dBm and 54.3%, 11.2 dB at 39.9 dBm and 53.4%, 9.1 dB at 37 dBm for a 10 MHz LTE signal with a 6.5 dB PAPR. This result demonstrates that the Doherty PA can be reconfigured for different average output powers using the bias voltage control method.
Keywords :
III-V semiconductors; UHF power amplifiers; gallium compounds; high electron mobility transistors; wide band gap semiconductors; APT; GaN; HEMT; PA; average power tracking Doherty power amplifier; drain bias voltage control method; efficiency 53.2 percent; efficiency 53.4 percent; efficiency 54.3 percent; frequency 1.94 GHz; frequency 10 MHz; gain 11.2 dB; gain 12.8 dB; gain 9.1 dB; gate bias voltage control method; high electron mobility transistor; noise figure 6.5 dB; power 45 W; Gain; Gallium nitride; HEMTs; Logic gates; Power amplifiers; Power generation; Wireless communication; Average power tracking (APT); Doherty power amplifier (DPA); Gallium nitride (GaN); drain efficiency (DE); long term evolution (LTE);
Journal_Title :
Microwave and Wireless Components Letters, IEEE
DOI :
10.1109/LMWC.2015.2429071