Title :
State-of-Charge Balance Using Adaptive Droop Control for Distributed Energy Storage Systems in DC Microgrid Applications
Author :
Xiaonan Lu ; Kai Sun ; Guerrero, Josep M. ; Vasquez, Juan C. ; Lipei Huang
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Tennessee, Knoxville, TN, USA
Abstract :
This paper presents the coordinated control of distributed energy storage systems in dc microgrids. In order to balance the state-of-charge (SoC) of each energy storage unit (ESU), an SoC-based adaptive droop control method is proposed. In this decentralized control method, the droop coefficient is inversely proportional to the nth order of SoC. By using a SoC-based droop method, the ESUs with higher SoC deliver more power, whereas the ones with lower SoC deliver less power. Therefore, the energy stored in the ESU with higher SoC decreases faster than that with lower SoC. The SoC difference between each ESU gradually becomes smaller, and finally, the load power is equally shared between the distributed ESUs. Meanwhile, the load sharing speed can be adjusted by changing the exponent of SoC in the adaptive droop control. The model of the SoC-based adaptive droop control system is established, and the system stability is thereby analyzed by using this model. Simulation and experimental results from a 2 × 2.2 kW parallel converter system are presented in order to validate the proposed approach.
Keywords :
adaptive control; decentralised control; distributed parameter systems; distributed power generation; energy storage; power convertors; stability; ESU; SoC; adaptive droop control method; dc microgrid applications; decentralized control method; distributed energy storage systems; energy storage unit; load power; load sharing; parallel converter system; stability; state-of-charge; Control systems; Energy storage; Microgrids; Power generation; Resistance; System-on-chip; Voltage control; DC microgrids; distributed energy storage system (DESS); droop control; state-of-charge (SoC);
Journal_Title :
Industrial Electronics, IEEE Transactions on
DOI :
10.1109/TIE.2013.2279374