• DocumentCode
    1758320
  • Title

    Repeatability and Mismatch of Waveguide Flanges in the 500–750 GHz Band

  • Author

    Huilin Li ; Arsenovic, Alexander ; Hesler, J.L. ; Kerr, A.R. ; Weikle, Robert M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng. Dept., Univ. of Virginia, Charlottesville, VA, USA
  • Volume
    4
  • Issue
    1
  • fYear
    2014
  • fDate
    Jan. 2014
  • Firstpage
    39
  • Lastpage
    48
  • Abstract
    This paper presents a study characterizing the connection repeatability and reflection coefficient of submillimeter waveguide flanges in the 500-750 GHz band (WR-1.5 or WM-380). The connection repeatability of four types of flange was measured using one-port measurements and a “load-reference” technique with a vertically mounted system to mitigate gravitational bias. To measure the error-corrected complex reflection coefficients of pairs of waveguide flanges, a calibration procedure insensitive to flange misalignment was used. This SDD(RO) calibration method employs four standards: a flush short, two delay shorts with different but unspecified offsets, and a radiating open-ended waveguide. The uncertainty associated with this calibration method is investigated and it is used to estimate the reflection coefficient resulting from flange misalignment.
  • Keywords
    calibration; submillimetre wave devices; waveguides; WM-380; WR-1.5; calibration; connection repeatability; delay shorts; error-corrected complex reflection coefficients; flange misalignment; flush short; frequency 500 GHz to 750 GHz; gravitational bias; load-reference technique; one-port measurements; radiating open-ended waveguide; submillimeter waveguide flanges; unspecified offsets; vertically mounted system; waveguide flange mismatch; waveguide flange repeatability; Calibration; Delays; Extraterrestrial measurements; Flanges; Measurement uncertainty; Phase measurement; Standards; Calibration; submillimeter-wave measurements; waveguide flanges; waveguide interfaces; waveguides;
  • fLanguage
    English
  • Journal_Title
    Terahertz Science and Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-342X
  • Type

    jour

  • DOI
    10.1109/TTHZ.2013.2283540
  • Filename
    6663704