Title :
Low ON-State Voltage Optically Triggered Power Transistor for SiC Emitter Turn-OFF Thyristor
Author :
Mojab, Alireza ; Mazumder, Sudip K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Chicago, Chicago, IL, USA
Abstract :
In this letter, a new optically triggered power transistor (OTPT) rated for 100-A load current is proposed. Moreover, some modifications in the base epitaxial layer are made to reduce both the ON-state voltage drop and the required optical power for the driving laser. This new structure benefits the fact that increasing the leakage current yields to a lower ON-state voltage in power semiconductor devices (PSDs). Although the proposed structure has a higher leakage current during the OFF-state, the high leakage current is blocked by a high-power low-leakage SiC thyristor that is connected in series with the proposed OTPT. Therefore, one can use the advantage of a rather leaky OTPT to further decrease the ON-state voltage. ON-state voltage drop of 0.8 V is achieved across the proposed OTPT in operating condition of 100 A and 100 °C while it is illuminated by optical power of 5 W. The proposed OTPT, respectively, features 22% and 92% improvement in the textscon-state voltage drop at optical powers of 5 and 2 W, as compared with the conventional low-leakage OTPT.
Keywords :
leakage currents; power transistors; silicon compounds; PSD; SiC; base epitaxial layer; current 100 A; driving laser; emitter turn-off thyristor; high-power low-leakage thyristor; leakage current; low on-state voltage optically triggered power transistor; low-leakage OTPT; power 2 W; power 5 W; power semiconductor devices; temperature 100 degC; textscon-state voltage drop; voltage 0.8 V; Doping; Leakage currents; Optical device fabrication; Optical switches; Silicon carbide; Stimulated emission; Thyristors; Emitter turn-off thyristor (ETO); Optically-triggered power transistor (OTPT); emitter turn-off thyristor (ETO); leakage current; on-state power loss; on-state voltage; optical power loss;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2015.2411218