Title :
Modeling and Application of Multi-Port TSV Networks in 3-D IC
Author :
Wei Yao ; Siming Pan ; Achkir, Brice ; Jun Fan ; Lei He
Author_Institution :
Cisco Syst., San Jose, CA, USA
Abstract :
Through-silicon-via (TSV) enables vertical connectivity between stacked chips or interposer and is a key technology for 3-D integrated circuits (ICs). While arrays of TSVs are needed in 3-D IC, there only exists a frequency-dependent resistance, inductance, conductance and capacitance circuit model for a pair of TSVs with coupling between them. In this paper, we develop a simple yet accurate circuit model for a multiport TSV network (e.g., coupled TSV array) by decomposing the network into a number of TSV pairs and then applying circuit models for each of them. We call the new model a pair-based model for the multiport TSV network. It is first verified against a commercial electromagnetic solver for up to 20 GHz and subsequently employed for a variety of examples for signal and power integrity analysis.
Keywords :
three-dimensional integrated circuits; 3D IC; 3D integrated circuits; capacitance circuit model; conductance; coupled TSV array; electromagnetic solver; frequency dependent resistance; inductance; interposer; multiport TSV networks; power integrity analysis; stacked chips; through silicon via; Capacitance; Impedance; Inductance; Integrated circuit modeling; Silicon; Solid modeling; Through-silicon vias; 3-D integration; conductance and capacitance (RLGC) matrices; crosstalk; inductance; modeling; packaging; power delivery; resistance; through-silicon via (TSV);
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2012.2228740