DocumentCode
175983
Title
Lot release strategy semiconductor assembly and testing based on the degree of constraint of the minimum spanning tree
Author
Zhang Guohui ; Chang Liu ; Yao Lili ; Shi Haibo
Author_Institution
R&D Center for Internet of things, China
fYear
2014
fDate
May 31 2014-June 2 2014
Firstpage
1735
Lastpage
1739
Abstract
The production of semiconductor assembly and testing is wide variety, and the cost of produce time of switch between different products is not the same, which could lead to its utilization is lower, production cycle longer. Thus lot release control plays an important role for improving utilization and shorter production cycle for semiconductor assembly and testing system. In this paper, we modeled as a graph theory for solving constrained minimum spanning tree problem. Using mainstream Prim algorithm, we solve it to give each product sequence and specific lot release time. It have solved the extra time problem that caused by blinding lot release, and finally, through applied research we verified the effectiveness and superiority of it. The proposed strategy can reduce the change machine costs, shorten production cycle and improve production efficiency.
Keywords
assembling; semiconductor device manufacture; trees (mathematics); change machine costs; constrained minimum spanning tree problem; graph theory; lot release control; lot release strategy semiconductor assembly; lot release time; mainstream Prim algorithm; product sequence; production cycle; production efficiency; testing system; Assembly; Companies; Decision support systems; Graph theory; Production; Testing; Ventilation; Prim algorithm; graph theory; minimum spanning tree; semiconductor assembly and testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Control and Decision Conference (2014 CCDC), The 26th Chinese
Conference_Location
Changsha
Print_ISBN
978-1-4799-3707-3
Type
conf
DOI
10.1109/CCDC.2014.6852449
Filename
6852449
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