DocumentCode
1761397
Title
Magnetic flux density measurement through phase decomposition using non-interleaved scan in MREIT
Author
Mun Bae Lee ; Woo Chul Jeong ; Sajib, Saurav Z. K. ; Hyung Joong Kim ; Oh In Kwon
Author_Institution
Dept. of Math., Konkuk Univ., Seoul, South Korea
Volume
51
Issue
12
fYear
2015
fDate
6 11 2015
Firstpage
890
Lastpage
892
Abstract
Magnetic resonance electrical impedance tomography (MREIT) measures the z-component of magnetic flux density B = (Bx, By, Bz) induced by externally injected current through a pair of electrodes. MREIT visualises in-vivo electrical current density and/or conductivity distribution in a three-dimensional imaging object from the measured magnetic flux density Bz. MREIT techniques typically use the phase difference approach in an interleaved encoding scheme by the injection of positive and negative currents to cancel systematic phase artefacts. Developed is a method to measure Bz data using only a single scan by the injection of one current, avoiding the interleaved encoding scheme. The method separates measured multiple k-space lines into acquired k-space lines with and without injection currents and develops an algorithm to measure the magnetic flux density Bz using acquired k-space lines by the injecting current. Results from phantom experiments demonstrate that the method has potential to measure magnetic flux density using only a single scan by the injection of one current.
Keywords
bioelectric phenomena; biomagnetism; biomedical MRI; biomedical electrodes; current density; electric impedance imaging; magnetic flux; phantoms; 3D imaging object conductivity distribution; MREIT techniques; externally injected current; gradient multiecho train pulse sequence; in vivo electrical current density; interleaved encoding scheme; magnetic flux density measurement; magnetic resonance electrical impedance tomography; multiple k-space lines; negative current injection; noninterleaved scan; phantom experiments; phase decomposition; positive current injection; scan duration reduction; single radio frequency pulse period; systematic phase artefact cancellation;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el.2015.0447
Filename
7122448
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