Compact Model for Inversion Charge in III–V Bulk MOSFET Including Non-Parabolicity

In this paper, Poisson-Schrödinger simulations of bulk MOSFETs with an InGaAs channel, including traps and nonparabolicity, are compared against experimental data. These simulations are later used to validate a compact model for the inversion charge in the channel as a function of the gate voltage. Finally, an expression for the long-channel drain current is derived from this inversion charge model, and confirmed with experimental data. This current model, adapted for alternative channel devices, is suitable for the evaluation of III-V MOSFET performance.