Input stimulus comparison using an adaptive FPGA-based testing system

Author

Sotirios, Pouros P. ; Vassilios, Vassios D. ; Dimitrios, Papakostas K. ; Alkis, Hatzopoulos A.

Author_Institution

Dept. of Electron. Eng. T.E., Alexander Technol. & Educ. Inst. of Thessaloniki, Thessaloniki, Greece

fYear

2014

fDate

1-5 June 2014

Firstpage

277

Lastpage

280

Abstract

In this paper the comparison of input stimulus signals using an adaptive FPGA-based testing system based on a method utilising wavelet transformation of the current waveforms is presented. The testing scheme is innovative because it offers the ability of applying different input stimulus signals with respect to the requirements of the examined circuit. Moreover, the method used is simple, offers a single-point test measurement solution and may easily be adapted to test various other analog and mixed-signal systems. Experimental results are presented showing the effectiveness of the proposed testing scheme.

Keywords

fault diagnosis; field programmable gate arrays; wavelet transforms; adaptive FPGA-based testing system; analog signal systems; input stimulus comparison; input stimulus signals; mixed-signal systems; single-point test measurement solution; wavelet transformation; Current measurement; Electrical fault detection; Fault detection; Field programmable gate arrays; Testing; Wavelet transforms; External Testing System; Fault Detection; Input Stimulus Selection;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems (ISCAS), 2014 IEEE International Symposium on

Conference_Location

Melbourne VIC

Print_ISBN

978-1-4799-3431-7

Type

conf

DOI

10.1109/ISCAS.2014.6865119

Filename

6865119