DocumentCode :
1768919
Title :
Reconfiguration network design for SEU recovery in FPGAs
Author :
Cetin, Ediz ; Diessel, Oliver ; Lingkan Gong ; Lai, V.
Author_Institution :
Sch. of Electr. Eng. & Telecommun., Univ. of New South Wales, Sydney, NSW, Australia
fYear :
2014
fDate :
1-5 June 2014
Firstpage :
1524
Lastpage :
1527
Abstract :
Field-Programmable Gate Array (FPGA) systems provide an ideal platform for meeting the computation requirements for future on-board processing. FPGAs, however, are susceptible to radiation-induced Single Event Upsets (SEUs). Techniques for partially reconfiguring a corrupted module of a Triple Modular Redundant (TMR) implementation have been described in the literature. In this paper we detail the design of a reconfiguration network that provides the infrastructure to enable SEU recovery in FPGAs. The reconfiguration network´s structure and operation is detailed along with performance analysis using results from simulated and implemented designs. The results indicate that total error recovery time from SEUs is dominated by the reconfiguration delay, and that the communication delay of the reconfiguration network is relatively small.
Keywords :
field programmable gate arrays; logic design; radiation hardening (electronics); FPGA system; SEU recovery; TMR; communication delay; field-programmable gate array; on-board processing; performance analysis; radiation-induced single event upsets; reconfiguration delay; reconfiguration network design; reconfiguration network structure; total error recovery time; triple modular redundant; Clocks; Delays; Field programmable gate arrays; Nickel; Ports (Computers); Radiation detectors; Tunneling magnetoresistance; Fault tolerance; radiation induced errors; reconfigurable hardware; reconfiguration network;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ISCAS), 2014 IEEE International Symposium on
Conference_Location :
Melbourne VIC
Print_ISBN :
978-1-4799-3431-7
Type :
conf
DOI :
10.1109/ISCAS.2014.6865437
Filename :
6865437
Link To Document :
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