Title :
Protecting combinational logic in pipelined microprocessor cores against transient and permanent faults
Author :
Wali, I. ; Virazel, A. ; Bosio, A. ; Dilillo, L. ; Girard, P. ; Todri, A.
Author_Institution :
LIRMM, Univ. of Montpellier 2, Montpellier, France
Abstract :
CMOS technology trends at one side open up some opportunities like making small and power efficient devices available, which in turn allow to put more functionality into a single chip. However, on the other side it poses some challenges like making devices vulnerable to hard and soft errors. In this paper we propose an efficient fault-tolerant architecture able to deal with permanent and transient faults in combinational parts of pipeline structures. The principle consists in triplicating the combinational logic parts but, unlike TMR, only two copies are running in parallel while the third one remains in standby until an error is detected. We implement this approach on a MIPS microprocessor as case study to make it resilient against transient and permanent faults.
Keywords :
CMOS logic circuits; combinational circuits; fault tolerance; microprocessor chips; CMOS technology; MIPS microprocessor; combinational logic protection; fault-tolerant architecture; hard errors; permanent faults; pipeline structures; pipelined microprocessor cores; power efficient devices; soft errors; transient faults; Circuit faults; Computer architecture; Fault tolerance; Fault tolerant systems; Microprocessors; Pipelines; Transient analysis; combinational logic; fault tolerance; microprocessor; redundancy; transient and permanent faults;
Conference_Titel :
Design and Diagnostics of Electronic Circuits & Systems, 17th International Symposium on
Conference_Location :
Warsaw
Print_ISBN :
978-1-4799-4560-3
DOI :
10.1109/DDECS.2014.6868794