DocumentCode
1775111
Title
Electrical performance of silicone rubber / SiO2 nanocomposites under low temperature
Author
Jingang Su ; Du, B. ; Tao Han ; Huanhuan Du
Author_Institution
Sch. of Electr. Eng. & Autom., Tianjin Univ., Tianjin, China
fYear
2014
fDate
1-5 June 2014
Firstpage
469
Lastpage
472
Abstract
This paper investigated the electrical tree growth process in SiR/SiO2 nanocomposites under the condition of low temperature. Samples were prepared by mixing nano-SiO2 into room temperature vulcanizing silicone rubber, with the content of 0, 0.5, 1, 1.5 and 2 wt% respectively. The experiment temperature ranged from - 30 °C to -90 °C. AC voltage with a frequency of 50 Hz was applied between a pair of needle-plate electrodes to investigate the electrical tree at different temperatures. The experimental results reveal that both nanoparticles and low temperature environment have a significant impact on the electrical tree growth characteristics of SiR/SiO2 composites. This paper studied electrical tree growth characteristics from the aspects such as the patterns of electrical tree, fractal dimension and the proportion of cumulative damage. It is suggested that there are both branch tree and bush tree when the temperature is -30 °C or -60 °C, but only pine tree when the temperature is -90 °C. It is also found that tree structure is closely related to the crystalline state.
Keywords
electrodes; nanocomposites; nanoparticles; silicon compounds; silicone rubber; trees (electrical); SiO2; branch tree; bush tree; crystalline state; electrical tree growth; fractal dimension; frequency 50 Hz; needle-plate electrodes; pine tree; silicone rubber nanocomposites; temperature 30 degC to -90 degC; Aging; Fractals; Monitoring; Nanocomposites; Nanomaterials; Temperature; Temperature measurement; crystalline state; fractal dimension; low temperature; nanocomposites; silicone rubber;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulating Materials (ISEIM), Proceedings of 2014 International Symposium on
Conference_Location
Niigata
Type
conf
DOI
10.1109/ISEIM.2014.6870820
Filename
6870820
Link To Document