• DocumentCode
    1778166
  • Title

    Precise fault-injections using voltage and temperature manipulation for differential cryptanalysis

  • Author

    Kumar, Ravindra ; Jovanovic, Philipp ; Polian, I.

  • Author_Institution
    Univ. of Massachusetts, Amherst, MA, USA
  • fYear
    2014
  • fDate
    7-9 July 2014
  • Firstpage
    43
  • Lastpage
    48
  • Abstract
    State-of-the-art fault-based cryptanalysis methods are capable of breaking most recent ciphers after only a few fault injections. However, they require temporal and spatial accuracies of fault injection that were believed to rule out low-cost injection techniques such as voltage, frequency or temperature manipulation. We investigate selection of supply-voltage and temperature values that are suitable for high-precision fault injection even up to a single bit. The object of our studies is an ASIC implementation of the recently presented block cipher PRINCE, for which a two-stage fault attack scheme has been suggested lately. This attack requires, on average, about four to five fault injections in well-defined locations. We show by electrical simulations that voltage-temperature points exist for which faults show up at locations required for a successful attack with a likelihood of around 0.1%. This implies that the complete attack can be mounted by approximately 4,000 to 5,000 fault injection attempts, which is clearly feasible.
  • Keywords
    application specific integrated circuits; cryptography; fault diagnosis; integrated circuit design; block cipher PRINCE; differential cryptanalysis; electrical simulations; fault-based cryptanalysis methods; high-precision fault injection; low-cost injection techniques; supply-voltage selection; temperature manipulation; temperature values; two-stage fault attack scheme; voltage manipulation; voltage-temperature points; Ciphers; Circuit faults; Clocks; Logic gates; Mathematical model; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium (IOLTS), 2014 IEEE 20th International
  • Conference_Location
    Platja d´Aro, Girona
  • Type

    conf

  • DOI
    10.1109/IOLTS.2014.6873670
  • Filename
    6873670