Electrical and chemical characterization of thin epoxy layers for high voltage applications

Author

Krivda, A. ; Straumann, U. ; Martinon, M. ; Logakis, E. ; Tsang, F. ; Narendran, M.

Author_Institution

ABB Switzerland Ltd., Baden-Daettwil, Switzerland

fYear

2014

fDate

19-22 Oct. 2014

Firstpage

816

Lastpage

819

Abstract

In this work epoxy based, mineral filled, thin layers are studied. Results of broadband dielectric spectroscopy ranging from -150°C to 100°C and 0.01 Hz to 1 MHz are presented. Fourier transform infrared spectroscopy, scanning electron microscopy, energy-dispersive X-ray spectroscopy and also X-ray diffraction were used for chemical characterization of the materials. On the base of the results, proper material candidates can be selected for a desired application.

Keywords

Fourier transform spectra; X-ray chemical analysis; X-ray diffraction; coatings; electric properties; filled polymers; infrared spectra; paints; scanning electron microscopy; Fourier transform infrared spectroscopy; X-ray diffraction; broadband dielectric spectroscopy; chemical characterization; electrical characterization; energy dispersive X-ray spectroscopy; epoxy based thin layer; high voltage applications; mineral filled thin layer; scanning electron microscopy; temperature -150 C to 100 C; thin epoxy layer; Conductivity; Current density; Dielectrics; Paints; Spectroscopy; Temperature measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulation and Dielectric Phenomena (CEIDP), 2014 IEEE Conference on

Conference_Location

Des Moines, IA

Type

conf

DOI

10.1109/CEIDP.2014.6995836

Filename

6995836