• DocumentCode
    178143
  • Title

    Neural Network Based Image Modification for Shape from Observed SEM Images

  • Author

    Iwahori, Y. ; Funahashi, K. ; Woodham, R.J. ; Bhuyan, M.K.

  • Author_Institution
    Dept. of Comput. Sci., Chubu Univ., Kasugai, Japan
  • fYear
    2014
  • fDate
    24-28 Aug. 2014
  • Firstpage
    2131
  • Lastpage
    2136
  • Abstract
    A new approach to recover 3-D shape from a Scanning Electron Microscope (SEM) image is described. With an ideal SEM image, 3-D shape can be recovered using the Fast Marching Method (FMM) applied to the Eikonal equation. However, when the light source direction is oblique, the correct shape cannot be obtained by the usual one-pass FMM. The new approach modifies the intensities in the original SEM image using an additional SEM image of a sphere and Neural Network (NN) training. Image modification is a two degree-of-freedom (DOF) rotation. No assumption is made about the specific functional form for intensity in an SEM image. The correct 3-D shape can be obtained using the FMM and NN learning, without iteration. The approach is demonstrated through computer simulation and validated through real experiment.
  • Keywords
    image processing; neural nets; scanning electron microscopy; 3D shape recovery; DOF rotation; Eikonal equation; FMM; NN learning; NN training; computer simulation; degree-of-freedom rotation; fast marching method; ideal SEM image; light source direction; neural network-based image modification; observed SEM images; one-pass FMM; scanning electron microscope; Accuracy; Artificial neural networks; Calibration; Light sources; Numerical analysis; Scanning electron microscopy; Shape;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition (ICPR), 2014 22nd International Conference on
  • Conference_Location
    Stockholm
  • ISSN
    1051-4651
  • Type

    conf

  • DOI
    10.1109/ICPR.2014.371
  • Filename
    6977083