Fault mitigation strategies for Single Event Transients on SAR converters

Author

Lanot, A.J.C. ; Balen, Tiago R.

Author_Institution

Dept. de Eng. Eletr., Programa de Pos Grad. de Eng. Eletr., Univ. Fed. do Rio Grande do Sul-Porto Alegre, Porto Alegre, Brazil

fYear

2014

fDate

17-19 Sept. 2014

Firstpage

1

Lastpage

6

Abstract

In this work, we analyze the resilience of SAR converters based on charge redistribution against Single Event Transients. These effects may be mitigated using well-known Fault Tolerance techniques. However, each strategy has its advantages and disadvantages, which may affect the area, power consumption, as well as the linearity of the circuit. This paper shows possible alternatives for the best trade-off approach on the design of such converters. Investigations were conducted by means of an extensive fault injection campaign in an 8-bit architecture modeled in SPICE, considering a 130nm predictive technology model.

Keywords

analogue-digital conversion; fault tolerance; integrated circuit modelling; radiation hardening (electronics); SAR converters; SPICE; charge redistribution; fault mitigation strategies; fault tolerance techniques; predictive technology model; single event transients; size 130 nm; Analytical models; Instruments; Integrated circuit modeling; Linearity; Predictive models; SPICE; Switches; ADC; Single-Event Transients; Successive-Approximation-Register; Transmission-Gates; fault injection; sizing; switches;

fLanguage

English

Publisher

ieee

Conference_Titel

Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), 2014 19th International

Conference_Location

Porto Alegre

Type

conf

DOI

10.1109/IMS3TW.2014.6997395

Filename

6997395