Automatic extraction of analytical large-signal FET models with parameter estimation by function decomposition

Author

van Raay, Friedbert ; Quay, Ruediger ; Seelmann-Eggebert, Matthias ; Schwantuschke, Dirk ; Peschel, Detlef ; Schlechtweg, Michael ; Ambacher, Oliver

Author_Institution

Fraunhofer Inst. of Appl. Solid-State Phys. (IAF), Freiburg, Germany

fYear

2014

fDate

6-7 Oct. 2014

Firstpage

202

Lastpage

205

Abstract

Modern analytic large-signal equivalent circuit models of microwave III-V active devices such as high electron mobility transistors (HEMTs) normally require a large effort in two-dimensional (2D) data fitting and extraction of parameter sets for numerical functions. In this paper, an entire automatic extraction procedure is proposed which relies on a decomposition of numerical function data into one-dimensional spurs and a subsequent starting value estimation and optional pre-optimization and final 2D fitting without user interaction. As a first validation, the fitting quality of the automatic procedure is demonstrated for two advanced AlGaN/GaN HEMT technologies with different gate lengths of 0.25 μm und 0.1 μm.

Keywords

III-V semiconductors; aluminium compounds; equivalent circuits; gallium compounds; high electron mobility transistors; parameter estimation; semiconductor device models; wide band gap semiconductors; 2D fitting; AlGaN-GaN; HEMT; analytical large-signal FET models; automatic extraction; function decomposition; high electron mobility transistors; large-signal equivalent circuit models; microwave III-V active devices; numerical function data; parameter estimation; parameter extraction; size 0.1 mum; size 0.25 mum; two-dimensional data fitting; Analytical models; Data mining; Data models; HEMTs; Integrated circuit modeling; Logic gates; MODFETs; AlGaN/GaN HEMT modeling; analytical models; model verification; parameter extraction;

fLanguage

English

Publisher

ieee

Conference_Titel

European Microwave Integrated Circuit Conference (EuMIC), 2014 9th

Conference_Location

Rome

Type

conf

DOI

10.1109/EuMIC.2014.6997827

Filename

6997827