Mixed diagnostic tests as innovation approach in VLSI engineering education

Mixed Diagnostic Tests as Innovation approach in VLSI Engineering Education is proposed. This approach is based on construction of the Intelligent training and testing system with usage of mixed diagnostic tests (MDT). Construction of mixed diagnostic tests that are a compromise between unconditional and conditional components is used in order to develop the blended education and training. It is proposed for control, monitoring students´ knowledge, professional and personal skills and abilities, and for designing learning trajectory of courses for every student. We suggest a technique for construction of optimal mixed diagnostic tests that is based only on the experts´ knowledge about a problem area. Educational programs on the VLSI Engineering Education that prepare students to meet these new requirements including discipline “Discrete mathematics”. Illustrative example from discipline “Discrete mathematics” on coverings of the Boolean matrix is proposed. The algorithm of finding all the shortest column coverings of the Boolean matrix is applicable to the VLSI design.