• DocumentCode
    1784413
  • Title

    Analysis of interfering signals in structures of integrated circuits

  • Author

    Novak, Jiri ; Foit, J.

  • Author_Institution
    Dept. of Microelectron., Czech Tech. Univ. in Prague, Prague, Czech Republic
  • fYear
    2014
  • fDate
    20-22 Oct. 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The electromagnetic compatibility serves as a measure for the possibility of coexistence of numerous electronic systems occupying a common environment without unwanted electromagnetic couplings that could interfere with correct functioning of individual systems [1]. The integrated circuits can be assumed to be independent electronic systems set up of individual operational blocks. The conveying of signals between blocks is provided by networks of electrical leads.
  • Keywords
    electromagnetic compatibility; electromagnetic coupling; integrated circuit interconnections; electrical leads; electromagnetic compatibility; electromagnetic couplings; integrated circuits structures; Couplings; Integrated circuit modeling; Joining processes; Logic gates; Pollution measurement; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Devices & Microsystems (ASDAM), 2014 10th International Conference on
  • Conference_Location
    Smolenice
  • Print_ISBN
    978-1-4799-5474-2
  • Type

    conf

  • DOI
    10.1109/ASDAM.2014.6998688
  • Filename
    6998688