DocumentCode
1784413
Title
Analysis of interfering signals in structures of integrated circuits
Author
Novak, Jiri ; Foit, J.
Author_Institution
Dept. of Microelectron., Czech Tech. Univ. in Prague, Prague, Czech Republic
fYear
2014
fDate
20-22 Oct. 2014
Firstpage
1
Lastpage
4
Abstract
The electromagnetic compatibility serves as a measure for the possibility of coexistence of numerous electronic systems occupying a common environment without unwanted electromagnetic couplings that could interfere with correct functioning of individual systems [1]. The integrated circuits can be assumed to be independent electronic systems set up of individual operational blocks. The conveying of signals between blocks is provided by networks of electrical leads.
Keywords
electromagnetic compatibility; electromagnetic coupling; integrated circuit interconnections; electrical leads; electromagnetic compatibility; electromagnetic couplings; integrated circuits structures; Couplings; Integrated circuit modeling; Joining processes; Logic gates; Pollution measurement; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Devices & Microsystems (ASDAM), 2014 10th International Conference on
Conference_Location
Smolenice
Print_ISBN
978-1-4799-5474-2
Type
conf
DOI
10.1109/ASDAM.2014.6998688
Filename
6998688
Link To Document