Stochastic reliability evaluation of Sea-of-Tiles based on Double Gate controllable-polarity FETs

In this paper, we introduce Bayesian network methods in order to evaluate the reliability of an application mapped onto the Sea-of-Tiles fabric based on DGFET nano devices. By using these methods, we show some interesting features of this kind of fabric at the functional level; the reliability of one tile of this fabric does not depend on the values of the control and the polarity gates, the diagnosis of a defective tile is possible with the input vector G = H = 1 (or G = H = 0) and with an observation on the value of the output F. Nevertheless, these features should also be checked at the device level to be more accurate. Bayesian networks give us the opportunity to estimate the reliability of a whole application mapped onto this fabric and to test the defective behaviour of tiles before the place-and-route procedure.