Title :
Asymmetric self-cascode FD SOI nMOSFETS harmonic distortion at cryogenic temperatures
Author :
d´Oliveira, Ligia Martins ; Trevisoli Doria, Rodrigo ; Pavanello, Marcelo Antonio ; de Souza, M. ; Kilchytska, V. ; Flandre, Denis
Author_Institution :
Electr. Eng. Dept., Centro Univ. da FEI, Sao Bernardo, Brazil
Abstract :
This paper presents an analysis on the linearity of Asymmetric Self-Cascode (A-SC) of FD SOI nMOSGET transistors at cryogenic temperatures. This is achieved by evaluating experimental results of associations of transistors with various combinations of channel doping, obtained at temperatures ranging between liquid helium temperature (LHT, 4K) and room temperature (300K). It has been observed that A-SC presents better analog characteristics than the Symmetric Self-Cascode (S-SC) even at temperatures below 100K. The results show improved harmonic distortion at cryogenic temperatures and for structures composed by transistors with lower channel doping.
Keywords :
MOSFET; cryogenic electronics; elemental semiconductors; harmonic distortion; semiconductor doping; silicon; silicon-on-insulator; A-SC; LHT; S-SC; Si; asymmetric self-cascode FD SOI nMOSFET transistor; channel doping; cryogenic temperature; harmonic distortion; liquid helium temperature; symmetric self-cascode; temperature 4 K to 300 K; SOI nMOSFETS; analog parameters; harmonic distortion; liquid helium temperature;
Conference_Titel :
Low Temperature Electronics (WOLTE), 2014 11th International Workshop on
Conference_Location :
Grenoble
DOI :
10.1109/WOLTE.2014.6881025