DocumentCode
178634
Title
Domain Adaptation under Data Misalignment: An Application to Cepheid Variable Star Classification
Author
Vilalta, R. ; Gupta, K.D. ; Macri, L.
Author_Institution
Dept. of Comput. Sci., Univ. of Houston, Houston, TX, USA
fYear
2014
fDate
24-28 Aug. 2014
Firstpage
3660
Lastpage
3665
Abstract
We address a particular scenario within the area of domain adaptation, where a predictive model obtained from a source domain can be applied directly to a target domain. Both source and target domains share the same input or feature space, but we do not impose any restrictions on the marginal and class posterior distributions (both distributions can differ). Our main assumption is that the difference between the source and target domains can be traced to a systematic change caused by some modification in the sensing device, or environment surrounding the phenomenon under analysis, as for example when the training and testing samples correspond to stars (i.e., to light curves) that belong to different galaxies. We demonstrate how such systematic change can be reversed by shifting the target data towards the source data until both distributions are aligned. Our approach uses maximum likelihood to compute the right amount of displacement along each variable under analysis. We test our methodology on the classification of Cepheid variable stars according to their pulsation mode: fundamental and first-overtone. Experimental results with three galaxy datasets (Large Magellanic Cloud, Small Magellanic Cloud, and M33), show the effectiveness of our approach.
Keywords
maximum likelihood estimation; variable stars; Cepheid variable star classification; M33; class posterior distributions; data misalignment; domain adaptation; environment surrounding; feature space; galaxy datasets; large magellanic cloud; light curves; marginal distributions; maximum likelihood methodology; predictive model; pulsation mode; sensing device; small magellanic cloud; source domain; target domain; Accuracy; Adaptation models; Data models; Systematics; Testing; Training; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition (ICPR), 2014 22nd International Conference on
Conference_Location
Stockholm
ISSN
1051-4651
Type
conf
DOI
10.1109/ICPR.2014.629
Filename
6977341
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