• DocumentCode
    1787589
  • Title

    A non-volatile memory based physically unclonable function without helper data

  • Author

    Wenjie Che ; Plusquellic, Jim ; Bhunia, Swarup

  • Author_Institution
    ECE Dept., Univ. of New Mexico, Albuquerque, NM, USA
  • fYear
    2014
  • fDate
    2-6 Nov. 2014
  • Firstpage
    148
  • Lastpage
    153
  • Abstract
    Stability across environmental variations such as temperature and voltage, is critically important for Physically Unclonable Functions (PUFs). Nearly all existing PUF systems to date need a mechanism to deal with “bit flips” when exact regeneration of the bitstring is required, e.g., for cryptographic applications. Error correction (ECC) and error avoidance schemes have been proposed but both of these require helper data to be stored for the regeneration process. Unfortunately, helper data adds time and area overhead to the PUF system and provides opportunities for adversaries to reverse engineer the secret bitstring. In this paper, we propose a non-volatile memory-based (NVM) PUF that is able to avoid bit flips without requiring any type of helper data. A voltage-to-digital converter technique is described for digitizing the analog entropy source and a robust median-finding algorithm is proposed as the reprograming strategy. Analysis on published experimental data is presented to demonstrate the practicability of our proposed strategy. We describe the technique in the context of emerging nano-devices, in particular, resistive random access memory (Memristor) cells, but the methodology is applicable to any type of NVM including Flash.
  • Keywords
    analogue-digital conversion; circuit stability; cryptography; error correction; random-access storage; ECC; NVM; PUF systems; analog entropy source; area overhead; bit flips; bitstring exact regeneration; cryptography; environmental variations; error avoidance schemes; error correction schemes; memristor cells; nano-devices; nonvolatile memory based physically unclonable function; reprograming strategy; resistive random access memory; robust median-finding algorithm; stability; time overhead; voltage-to-digital converter technique; Entropy; Histograms; Memristors; Nonvolatile memory; Random access memory; Reliability; Resistance; Helper data; Memristor; Physically Unclonable Functions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design (ICCAD), 2014 IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA
  • Type

    conf

  • DOI
    10.1109/ICCAD.2014.7001345
  • Filename
    7001345