Title :
ICCAD-2014 CAD contest in design for manufacturability flow for advanced semiconductor nodes and benchmark suite
Author :
Topaloglu, Rasit O.
Author_Institution :
Semicond. R&D Center, IBM, Hopewell Junction, NY, USA
Abstract :
We introduce the fill optimization problem and benchmarks. We provide two new hotspot definitions, slot line deviation and outliers, both of which pertain to yield. We provide the inputs, expected output, as well as objectives and constraints of the problem.
Keywords :
design for manufacture; optimisation; production engineering computing; semiconductor industry; DFM; benchmark suite; design for manufacturability; fill optimization problem; hotspot definitions; semiconductor nodes; slot line deviation; Central Processing Unit; Integrated circuit modeling; Layout; Measurement; Program processors; Runtime; Slot lines;
Conference_Titel :
Computer-Aided Design (ICCAD), 2014 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
DOI :
10.1109/ICCAD.2014.7001377
