DocumentCode
1789155
Title
An algorithmic approach for leakage current reduction in deep sub-micron CMOS circuits
Author
Done, Manikya Vara Prasad ; Panwar, Uday ; Khare, Kavita
Author_Institution
Dept. of ECE, MANIT, Bhopal, India
fYear
2014
fDate
10-11 Oct. 2014
Firstpage
1
Lastpage
5
Abstract
There are several techniques available to control the leakage current in deep sub-micron technologies. One of the techniques is the Input Vector Control (IVC). By using IVC, leakage power consumption of a circuit can be minimized in the off state. In this paper, an algorithm has been given to calculate the best input vector that can be applied to the circuit (designed with 65nm technology transistors) in the off state for obtaining the low leakage current. The concept of controllability of the nodes in the circuit and the inter dependency of the gates in the circuit were used to determine the best input vector in the algorithm. Exclusive OR gate with NAND gates is used to test the algorithm, the results showed that the algorithm gives an input vector that can be applied to the circuit in the sleep state which is same as that of the vector obtained using an exhaustive search in CADENCE SPECTRE, with less computational time.
Keywords
CMOS integrated circuits; leakage currents; semiconductor device breakdown; semiconductor device reliability; CADENCE SPECTRE; IVC; NAND gates; deep submicron CMOS circuits; exclusive OR gate; input vector control; leakage current reduction; leakage power consumption; sleep state; CMOS integrated circuits; Controllability; Leakage currents; Logic gates; Threshold voltage; Transistors; Vectors; CMOS combinational circuits; Deep sub-micron Technology; Input Vector Control; Leakage current reduction;
fLanguage
English
Publisher
ieee
Conference_Titel
Advances in Electronics, Computers and Communications (ICAECC), 2014 International Conference on
Conference_Location
Bangalore
Type
conf
DOI
10.1109/ICAECC.2014.7002480
Filename
7002480
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