Title :
New scanning probe microscopy near-field imaging method for laser radiation intensity mapping
Author :
Alekseev, P.A. ; Dunaevskiy, M.S. ; Monahov, A.M. ; Titkov, A.N. ; Baranov, A.N. ; Girard, P. ; Teissier, R.
Author_Institution :
Ioffe Inst., St. Petersburg, Russia
fDate :
June 30 2014-July 4 2014
Abstract :
Novel scanning probe microscopy method of near field imaging of laser radiation is proposed. The method providing a submicron spatial resolution is based on detection of a shift of the probe resonance related to its heating by absorbed radiation. The method has been realized with a conventional silicon probe and has been employed for visualization of infrared emission from a half-disk semiconductor whispering gallery mode laser.
Keywords :
laser modes; measurement by laser beam; scanning probe microscopy; semiconductor lasers; whispering gallery modes; absorbed radiation heating; half-disk semiconductor whispering gallery mode laser; infrared emission; laser radiation intensity mapping; near-field imaging method; probe resonance; scanning probe microscopy; silicon probe; submicron spatial resolution; Gain measurement; Laser modes; Measurement by laser beam; Visualization; laser radiation; near field; scanning probe microscopy;
Conference_Titel :
Laser Optics, 2014 International Conference
Conference_Location :
Saint Petersburg
Print_ISBN :
978-1-4799-3884-1
DOI :
10.1109/LO.2014.6886366
